|
|
Offer
From Non Premium Member |
|
|
|
Type: |
Sell |
Subject: |
Thin Film Measurement System |
Description: |
Measurement System for Thin Films on LCD and Wafer is a new-age reasonably priced instrument for measurement of such characteristics of thin films as thickness and optical constants. We can provide 50x50cm sample stage for wafer measurement and one square meter sample stage for LCD measurement. Optionally we provide programmable X-Y stage, motorized Z axis, CCD camera, auto focusing. The measurement range is 100A-50um.The measured spot size is 40/20/10/4 um. Data acquisition time is typically 0.5 sec.
|
Placement Date: |
Feb 25, 2005 |
Expiration Date: |
Jan 01, 2010 |
|
|
|
|
|
|
Company Name: |
K-MAC, Korea Materials & Analysis Corporation |
Contact Person: |
Ms Vera Shapovalova |
City: |
Taejon |
Country: |
South Korea
|
Local Time: |
|
E-mail: |
Premium
Membership Required (Join Free Today) |
|
Introduction: |
K-MAC supplies high-quality instruments for analysis and thin film metrology: UV-Vis Fiber Optic Spectrophotometer, Measurement System for Thin Films, LCD and Wafer, Refractive Index and Thin Film Thickness Measurement System, Flow Injection Analyzer, Chiral HPLC Columns, Colorimeter, SPR (Surface Plasmon Resonance) System. We plan to develop Remote Medical Inspection Controleler and Telepathology Controller
|
Business Type: |
Exporter |
Areas of Interest: |
1. Electronics & Electricals/Components 2. Machinery & Tools/Machinery 3. Machinery & Tools/Other
|
|