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Offer
From Non Premium Member |
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Type: |
Sell |
Subject: |
Refractive Index Meas. System |
Description: |
High Quality, Competitively Priced Refractive Index and Thin Film Thickness Measurement System is intended specially for precise refractive index measurement. Based on Dual Reflectometer, this instrument allows to measure not only normal vertical reflectance, but also incident one. Besides it can be applied to measure thin film thickness. Please, contact us for specifications.
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Placement Date: |
Feb 25, 2005 |
Expiration Date: |
Jan 01, 2010 |
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Company Name: |
K-MAC, Korea Materials & Analysis Corporation |
Contact Person: |
Ms Vera Shapovalova |
City: |
Taejon |
Country: |
South Korea
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Local Time: |
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E-mail: |
Premium
Membership Required (Join Free Today) |
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Introduction: |
K-MAC supplies high-quality instruments for analysis and thin film metrology: UV-Vis Fiber Optic Spectrophotometer, Measurement System for Thin Films, LCD and Wafer, Refractive Index and Thin Film Thickness Measurement System, Flow Injection Analyzer, Chiral HPLC Columns, Colorimeter, SPR (Surface Plasmon Resonance) System. We plan to develop Remote Medical Inspection Controleler and Telepathology Controller
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Business Type: |
Exporter |
Areas of Interest: |
1. Electronics & Electricals/Components 2. Machinery & Tools/Machinery 3. Machinery & Tools/Other
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