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Company Name: |
K-MAC, Korea Materials & Analysis Corporation |
| Contact Person: |
Ms Vera Shapovalova |
| City: |
Taejon |
| Country: |
South Korea
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| Local Time: |
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| E-mail: |
Premium
Membership Required (Join Free Today) |
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| Introduction: |
K-MAC supplies high-quality instruments for analysis and thin film metrology: UV-Vis Fiber Optic Spectrophotometer, Measurement System for Thin Films, LCD and Wafer, Refractive Index and Thin Film Thickness Measurement System, Flow Injection Analyzer, Chiral HPLC Columns, Colorimeter, SPR (Surface Plasmon Resonance) System. We plan to develop Remote Medical Inspection Controleler and Telepathology Controller
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| Business Type: |
Exporter |
| Areas of
Interest: |
1. Electronics & Electricals/Components
2. Machinery & Tools/Machinery
3. Machinery & Tools/Other
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Offers
From This Member (4) |
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[Sell] Refractive Index Meas. System |
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High Quality, Competitively Priced Refractive Index and Thin Film Thickness Measurement System is intended specially for precise refractive index measurement. Based on Dual Reflectometer, this instrument allows to measure not only normal vertical reflectance, but also incident one. Besides it can be applied to measure thin film thickness. Please, contact us for specifications.
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| » Machinery & Tools/Other |
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[Sell] Chiral HPLC Columns |
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Chiral columns are used for the direct separation of enantiomers. These Columns are excelent tools for the determination of enantimeric purity of drugs and for the analysis of enantiomers of drugs
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| » Machinery & Tools/Machinery |
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[Sell] Thin Film Measurement System |
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Measurement System for Thin Films on LCD and Wafer is a new-age reasonably priced instrument for measurement of such characteristics of thin films as thickness and optical constants. We can provide 50x50cm sample stage for wafer measurement and one square meter sample stage for LCD measurement. Optionally we provide programmable X-Y stage, motorized Z axis, CCD camera, auto focusing. The measurement range is 100A-50um.The measured spot size is 40/20/10/4 um. Data acquisition time is typically 0.5 sec.
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| » Electronics & Electricals/Components |
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[Sell] UV-Vis Spectrophotometer |
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UV-Vis-NIR fiber optic spectrophotometer is used for fast speed non-destructive analysis of sample from its wavelength data. With linear CCD array detector, effective range is 185-1100 nm, the resolution is 0.3-10 nm, integration time 3 milli sec - 1 minute.
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| » Electronics & Electricals/Components |
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